Review
Non-contact techniques for studiyng the critical properties of superconductors
A. Yu. Levakhova
Ginzburg Centre, Lebedev Physical Institute of the RAS, Leninsky ave., 53, 119991, Moscow, Russia
e-mail: levakhovaayu@lebedev.ru
S. Yu. Gavrilkin
Ginzburg Centre, Lebedev Physical Institute of the RAS, Leninsky ave., 53, 119991, Moscow, Russia
A. Yu. Tsvetkov
Ginzburg Centre, Lebedev Physical Institute of the RAS, Leninsky ave., 53, 119991, Moscow, Russia
Abstract
This paper provides an overview of the main non-contact methods for measuring critical parameters of superconducting materials. Their classification has been carried out. The main focus is on induction contactless techniques and devices based on them, as the most promising.
Keywords: critical current; high-temperature superconductors; non-contact methods.
References
[1] J. H. Claassen, M. E. Reeves, R. J. Soulen, Rev. Sci. Instrum. 62, 996 (1991). DOI: 10.1063/1.1141991
[2] G.D. Poulin, J.S. Preston, T. Strach, Phys. Rev. B 48, 1077 (1993). DOI: 10.1103/PhysRevB.48.1077
[3] Y. Mawatari, H. Yamasaki, Y. Nakagawa, Appl. Phys. Lett. 81, 2424 (2002). DOI: 10.1063/1.1510159
[4] H. Yamasaki, Y. Mawatari, and Y. Nakagawa, Appl. Phys. Lett. 82, 3275 (2003). DOI: 10.1063/1.1571657
[5] H. Yamasaki, Y. Mawatari, Y. Nakagawa, H. Yamada, IEEE Trans. Appl. Supercond. 13, 3718 (2003). DOI: 10.1109/TASC.2003.812524
[6] Y. Mawatari, H. Yamasaki, Y. Nakagawa, Appl. Phys. Lett. 83, 3972 (2003). DOI: 10.1063/1.1625423
[7] H. Yamasaki, Y. Mawatari, Y. Nakagawa, IEEE Trans. Appl. Supercond. 15, 3636 (2005). DOI: 10.1109/TASC.2005.849378
[8] Zh. Xu, W. Zhi-Zhen, Zh. Tie-Ge, H. Ming, Zh. Xin-Jie, Y. Shao-Lin, F. Lan, Chin. Phys. B 20, 027401 (2011). DOI: 10.1088/1674-1056/20/2/027401
[9] C.P. Bean, Rev. Mod. Phys. 36, 31 (1964). DOI: 10.1103/RevModPhys.36.31
[10] J. Talvacchio, Rev. Sci. Instrum. 54, 16 (1983).
[11] W. Xing, B. Heinrich, J. Chrzanowski, C. Irwin, H. Zhou, A. Cragg, A.A. Fife, Physica C 205, 311 (1993).
[12] H. Yamada, A. Bitoh, Y. Mitsuno, I. Imai, K. Nomura, K. Kanayama, S. Nakagawa, Y. Mawatari, H. Yamasaki, Physica C 433, 59 (2005). DOI: 10.1016/j.physc.2005.09.012
[13] F. Gamboa, V. Sosa, I. Perez, J.A. Matutes-Aquino, A. Moewes. In situ comparison of the critical current density in thin films measured by the screening technique under two criteria // arXiv.com, 2013. URL: https://arxiv.org/abs/1304.1475
[14] M. Aurino, E.D. Gennaro, F.D. Iorio, A. Gauzzi, G. Lamura, A. Andreone, J. Appl. Phys. 98, 123901 (2005). DOI: 10.1063/1.2142097
[15] H. Yamada et al., Physica C 451, 107 (2007).
[16] A. Kamitani et al., Physica C 469, 1254 (2009).
[17] N.D. Kuz’michyov, ZhTF 64, 63 (1994).
[18] Y. Mawatari, A. Sawa, H. Obara, M. Umeda, H. Yamasaki, Appl. Phys. Lett. 70, 2300 (1997). DOI: 10.1063/1.118842